SEMINAR: IMAGING OF NON-CONDUCTIVE SAMPLE WITH EXTREME HIGH RESOLUTION SEM

Date

20 November – 21 November 2019

Venue

Microscopy Lab, Science and Engineering Research Centre (SERC), USM Engineering Campus, Nibong Tebal, Pulau Pinang.

No. of Participants

24 participants (students, researchers and industries)

Invited Speaker

Mr JiangFeng Chen, Application Engineer, Thermo Fisher Scientific, Shanghai, China.

Objectives

• To explore on cutting-edge technology of FESEM and its application specifically for non-conductive samples.
• To have the discussion with the invited speaker on the issue and challenge with the samples.
• To provide the great platform for participants to understand and explore how the new technology can offer the remedies for current and future applications needs.

Collaborative and Jointly Organized by:

v  ThermoFisher Scientific

v  Histocenter

v  Science and Engineering Research Centre (SERC), USM