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High Resolution Transmission Electron Microscope (HRTEM) 200kV with Field Emission, TECNAI G2 20 S-TWIN, FEI

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Instrument Name & Model:  High Resolution Transmission Electron Microscope (HRTEM) 200kV with Field Emission, TECNAI G2 20 S-TWIN, FEI
 

Special Features
- STEM, HR-STEM, Z-contrast
- TEM, HR-TEM
- Oil-free vacuum system
- Fully integrated motorized apertures
- Low background double tilt holder for EDX on zone axis (Si<110>)
- S2-93 compliant
- Remote operation
- E xcellent stability of focus, high tension,
- energy spread, spot, alignment and specimen stage
- Complete and fast recall of all modes and accelerating voltage settings
- Full digital control of STEM/TEM and accessories
- Easy and secure operation in a multiuser environment
- The “All in One” Tecnai Next generation G2
- EDX
- Plasma Cleaning System

Applications
- Microscope for materials science offering an unprecedented combination of ultra-high resolution in TEM imaging, nano-analysis, diffraction plus scanning.

Location: Microscope Room (G045)

Contact:

ELECTRON MICROSCOPY LAB

Mohd Zharif B. Ahmad Thirmizir
Email : Alamat emel ini dilindungi dari Spambot. Anda perlu hidupkan JavaScript untuk melihatnya. 
Tel : 04-599 6505  Fax : 04-599 6915
Science and Engineering Research Centre (SERC)
Engineering Campus
Universiti Sains Malaysia
14300 Nibong Tebal, Penang, Malaysia