Seminar on Stylus Nano Profiler CP200

 Science and Engineering Research Centre (SERC), USM SERC, in collaboration with Novatis Scientific Sdn. Bhd., successfully hosted a seminar introducing the high-precision Stylus Nano Profiler CP200. The session highlighted the instrument’s advanced capabilities in measuring surface roughness, step height, and film thickness, providing valuable insights for both research and industrial applications.The program combined theoretical knowledge with practical demonstrations, allowing participants to gain hands-on experience with the equipment. The event received positive feedback and fostered meaningful exchanges between academia and industry.