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Pusat Penyelidikan Sains & Kejuruteraan
Science & Engineering Reseach Center (SERC)

ZEISS MICROSCOPY SEMINAR - FROM 3D IMAGING TO NANOMATERIALS RESEARCH

July 4, 2024 - ZEISS MICROSCOPY SEMINAR: FROM 3D IMAGING TO NANOMATERIALS RESEARCH.

Venue & Time: Seminar Room SERC, 8.15 am – 2.00 pm.

Objectives Event:
1. To introduce new technology of 3D Microscopy
2. To describe the revolution in sample preparation, imaging and analytical analysis of advanced materials using FIB SEM and laser FIB from ZEISS
3. To introduce Laser Scanning Confocal Microscopy as a versatile technique

Honourable Speakers:

Mr. Yap Eng Sam
Topic 1: New frontiers for high-resolution and non-destructive 3D imaging with ZEISS X-Ray Microscope (XRM)

Dr. Sky Xie
Topic 2: Revolution of Sample Preparation, Superior Imaging and Advanced Analytics of Material Science Samples with ZEISS Crossbeam Focus Ion Beam-Scanning Electron Microscope (FIB-SEM) & Laser FIB

Topic 3: Perform High-Resolution Imaging, Advanced Analytics and Correlative Microscopy Workflow with ZEISS Gemini Field Emission-Scanning Electron Microscope (FE-SEM)

Dr. Lim Siang Hui
Topic 4: ZEISS Laser Scanning Confocal Microscopy (LSCM): Versatile Imaging for Living and Non-Living Structures

Here is a sneak peek at the pictures from the event. Thank you to all the participants for joining us!

Text and Photo: Nor Hayati Binti Darudin / Editing: Nur Ezzah Abdul Kahar