FAILURE ANALYSIS
Failure analysis is the systematic investigation that involved the process of collecting and analyzing data to determine the root causes of failure and to take actions to prevent future failure or to prevent it from reoccurring.
It depends on collecting failed components for subsequent assessment and checking the cause or causes of failure using a wide array of methods, especially microscopy, spectroscopy, and x-ray.
The failure analysis of many different products involves the use of the following tools and techniques:
- High-Resolution Transmission Electron Microscopy (HRTEM)
- Field Emission Scanning Microscopy (FESEM)
- X-ray Photoelectron Spectroscopy (XPS)
- Laser Confocal Scanning Microscopy (LSM)
- Spotlight TM 400 FT-IR Imaging System
- Inductive Coupled Plasma Mass-Spectroscopy (ICP-MS)
- Raman Spectroscopy