Applications

ANALYTICAL IMAGING
• Particle analysis and identification
- Identification of physical and chemical defects
- Elemental analysis of solid samples
- Detection of impurities
Instruments :  HRTEM, FESEM, XPS, LSM, FTIR

FAILURE ANALYSIS
• Failure and fracture characterization and analysis
Instruments : HRTEM, FESEM

PARTICLE ANALYSIS
• Measurement for particle size, particle size distribution, surface area measurement and more
Instruments :  HRTEM, FESEM

MATERIAL CHARACTERIZATION
• Characterize the material structure down to the nanometer scale
• Investigate polymer morphology and microstructure, composite structure, failure analysis and degradation.
• Analysis of layer structure, layer thickness and surface topography
• Identify grain size and structure, phase distribution, microscopic defects and method of product made.
• Identify material properties, strength, durability and gerformance
Instruments :  HRTEM,FESEM, XPS, RAMAN

CHEMICAL ANALYSIS
• Determine chemical identity, composition quality and impurities
• Trace organic compounds and metals
• Analysis, detection and identification of residues
Instruments :  GC-MS, GC, HPLC

CONTAMINATION
• Detect, isolate and identify suspected contaminant
Instruments :  XPS, FTIR, FESEM-EDX, ICP-MS

SURFACE CHEMICAL ANALYSIS
• Determine the elements and molecules present in the outer layers of solid samples
• Analyze surface coverage, molecular orientation, and functionalization
Instruments :  XPS, FTIR

ELEMENTAL ANALYSIS
• Identification and quantification of elements in a diverse range of samples
• Determination of elemental composition
• Detect elemental trace and ultra trace analysis range from parts per million (ppm) until parts per billion (ppb) levels.
Instruments :  HRTEM,ICP-MS, AAS, FESEM-EDX

SAMPLE PREPARATION
• Ultramicrotomy - ambient and cyro temperature
• Polishing Ion Precision System
• Precision Etching Coating System
• Coating